In Automatic Wafer Test, three common major problems occur: poor signal performance, lack of space in production and high equipment acquisition costs.
Direct Docking by Turbodynamics has been in use for more than 10 years - at test houses as well as at almost all IDM manufacturers.
A high level of automation and repeatability in the µm range at docking forces above 3,000 N ensure maximum performance.
Direct Docking is maintenance-free and compatible for all existing systems of 8'' and 12'' Probers. A list of compatible systems from Advantest, Cohu, Terradyne, National instruments and SPEA can be found here:
- V93K ATH test head
- Micro P-Dock® Solution - V93K CTH test head
- Micro P-Dock® Solution - V93K STH test head
- Micro P-Dock® Solution - V93K LTH test head
- Micro P-Dock® Solution - T2000 26 slot
- Micro P-Dock® Solution - T2000 52slot
- Micro P-Dock® Solution
- LTXC Fusion MX
- Micro P-Dock® Solution - LTXC Fusion EX
- Micro P-Dock® Solution - LTXC Fusion LX
- P-Dock® Solution - LTXC Diamond X1
- Micro P-Dock® Solution - LTXC Diamond X2
- Micro P-Dock® Solution - LTXC DxV
- Micro P-Dock® Solution
- Eagle Test 364
- Micro P-Dock® Solution - Micro Flex
- Micro P-Dock® Solution
Integra Flex
- Micro P-Dock® Solution - Ultra Flex HD - 12 Slot
- Micro P-Dock® Solution - Ultra Flex HD - 24 Slot
- Micro P-Dock® Solution
- STS T1 /M1 and M2
- Micro P-Dock® Solution - STS T2 /M1 and M2
- Micro P-Dock® Solution - STS T4 /M1 and M2
- Micro P-Dock® Solution
- DOT 800
- Micro P-Dock® Solution
If you would like to learn more about our products, please contact us!