In Automatic Wafer Test, three common major problems occur: poor signal performance, lack of space in production and high equipment acquisition costs.
Direct Docking by Turbodynamics has been in use for more than 10 years - at test houses as well as at almost all IDM manufacturers.
A high level of automation and repeatability in the µm range at docking forces above 3,000 N ensure maximum performance.
Direct Docking is maintenance-free and compatible for all existing systems of 8'' and 12'' Probers. A list of compatible systems from Advantest, Cohu, Terradyne, National instruments and SPEA can be found here:
- DOT 800
- Micro P-Dock® Solution
If you would like to learn more about our products, please contact us!