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ATE Docking Systems

For Final Test Handling

Our Docking Systems combine Automatic Test Equipment and Device Handling Systems. The patented P-Dock and F-Dock clamping systems serve as a base and are tried and tested throughout the Semiconductor Industry.

The docking process takes place with a repeatable accuracy of less than 10 µm. High docking forces of up to several 1000 N per unit at shortest Z-Stack distance and zero maintenance are further advantages of our system.

Our customers benefit from safety, repeatability and operator-friendliness, combined with highest precision. The systems are compatible with all common types of Handlers, Probers and Testers.

P-Dock is a pneumatic system that reliably avoids errors using sensor support.

Our F-Dock Systems offer easy handling in the Final Test. The one-operator handling saves time and manpower, the variable mechanical locking adapts perfectly to the Z-Stack of handler contact units.

P-Dock

Turbodynamics P-Dock® Systems have an installed base of almost 1000 systems worldwide over the past 10 years. 

F-Dock

Turbodynamics F-Dock Systems have an excellent handling for Final Test. The patented construction ensures one-person operation.

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